- global pins have been generated for device cells too and lead
to implicit pins which may not be desired. The original problem
was how to make abstract circuits comparable. This has to be
solved differently.
- Circuit boundaries are good for displaying the boxes for
abstract circuits
General topic: abstracts and swappable pins.
Issue: we work bottom up and assign pins. This is the
basis for net graph building. But swappable means those
pins can change. The compare works fine, but debugging
output is strange: as the pin assigned is fixed, the nets
found to be attached to a circuit might not fit any
proposed pin pair (which does not contain swapping).
The problem gets worse with abstracts.
The enhancements are
- Such cases generate only warnings in the browser
and the message says swapping might be the case
- Floating nets are treated differently. This should
lead to a better performance for abstracts/black boxes,
but in case of disconnected pins (due to wire errors),
floating nets happen to create mismatches in the nets above.
- Net graph building does not consider swappable nets. In
case of two swappable pins this wouldn't be an issue, but
for more than two this would create ambiguities and
prevent topological matching.
Plus: Debug output option for net graph
Tests updated
- For unattached subcircuit pins no error should be reported
- For abstract nets, graph propagation through subcircuit pins isn't attempted.
Abstract nets are only dummy-associated currently.
Reason: when a circuit does not have pins and is top level,
but the reference has pins, the reference pins are regarded
to match against (nil). This case has to be reported properly,
otherwise the model can't be built consistently.
- LVS DSL debugging, enhancements
- Allow polygons with holes in L2N
- Spice Reader: was creating too many class objects
- Device class categorizer: allow associating A->C,B-C
- ...