Issue solved: some circuit pins may not have a net - these
need to be ignored.
Requirement: all pins with a net must be mapped.
Detached pins are not present in the mapping table.
A dummy mapping table was introduced to allow dropping
of pins in the second circuit too.
Output of compare should not depend on memory location
anymore and pin mismatch reporting should include all
pins.
- edge pairs are normalized before turning them into polygons.
This makes flat and deep implementation more consistent.
- deep region and flat regions were not cooperating in geo
checks
- unnamed layers are not registered in make_layer - this
does not make sense and will just hold a fake ref
- tests now use GDS to represent texts after transformation
(with orientation, OASIS can't do this)
- texts are more consistently handled in the tests
- test debug output is not written in the same format
than golden data unless special normalization is
requested.
- a non-orientable polygon was converted to orientable in
a text because this can be represented in GDS consistently
- DRC testsuite uses "polygons" instead of "input" to achieve
identical behavior for deep and flat mode with respect to
texts
- dbRegionTests are updated because texts are not allowed
for non-original layers too
The device handling in the netlist extractor was now
entirely moved to device cells. New options are introduced
for exporting these cells. Tests have been updated.
The main entry point is RBA::LayoutToNetlist which is the
GSI binding for the layout to netlist extractor. For a first
impression about the abilities of this extractor see the
Ruby tests in testdata/ruby/dbLayoutToNetlist.rb.
The framework itself consists of many classes, specifically
- RBA::Netlist for the netlist representation
- RBA::DeviceClass and superclasses (e.g. RBA::DeviceClassResistor and
RBA::DeviceClassMOS3Transistor) for the description of devices.
- RBA::DeviceExtractor and superclasses (i.e. RBA::DeviceExtractorMOS3Transistor or
the generic RBA::GenericDeviceExtractor) for the implementation of the
device extraction.
- RBA::Connectivity for the description of inter- and intra-layer connections.