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WIP: fixed BJT4 class, added RBA tests for new device classes.

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This commit is contained in:
Matthias Koefferlein
2019-06-15 21:11:15 +02:00
parent e939d51104
commit a91c3d3a4e
3 changed files with 367 additions and 10 deletions
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src/db/unit_tests/dbNetlistDeviceClassesTests.cc
+92
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@@ -2107,3 +2107,95 @@ TEST(39_ParallelBJT3Transistors)
);
}
TEST(40_ParallelBJT4Transistors)
{
db::DeviceClassBJT4Transistor *cls = new db::DeviceClassBJT4Transistor ();
db::Netlist nl;
nl.add_device_class (cls);
db::Device *d1 = new db::Device (cls, "d1");
d1->set_parameter_value (db::DeviceClassBJT4Transistor::param_id_AE, 2.0);
d1->set_parameter_value (db::DeviceClassBJT4Transistor::param_id_PE, 12.0);
d1->set_parameter_value (db::DeviceClassBJT4Transistor::param_id_AB, 3.0);
d1->set_parameter_value (db::DeviceClassBJT4Transistor::param_id_PB, 13.0);
d1->set_parameter_value (db::DeviceClassBJT4Transistor::param_id_AC, 4.0);
d1->set_parameter_value (db::DeviceClassBJT4Transistor::param_id_PC, 14.0);
db::Device *d2 = new db::Device (cls, "d2");
d2->set_parameter_value (db::DeviceClassBJT4Transistor::param_id_AE, 3.0);
d2->set_parameter_value (db::DeviceClassBJT4Transistor::param_id_PE, 13.0);
d2->set_parameter_value (db::DeviceClassBJT4Transistor::param_id_AB, 4.0);
d2->set_parameter_value (db::DeviceClassBJT4Transistor::param_id_PB, 14.0);
d2->set_parameter_value (db::DeviceClassBJT4Transistor::param_id_AC, 5.0);
d2->set_parameter_value (db::DeviceClassBJT4Transistor::param_id_PC, 15.0);
db::Circuit *circuit = new db::Circuit ();
nl.add_circuit (circuit);
db::Pin pin_a = circuit->add_pin ("A");
db::Pin pin_b = circuit->add_pin ("B");
db::Pin pin_c = circuit->add_pin ("C");
db::Pin pin_d = circuit->add_pin ("D");
circuit->add_device (d1);
circuit->add_device (d2);
db::Net *n1 = new db::Net ("n1");
circuit->add_net (n1);
circuit->connect_pin (pin_a.id (), n1);
d1->connect_terminal (db::DeviceClassBJT4Transistor::terminal_id_C, n1);
d2->connect_terminal (db::DeviceClassBJT4Transistor::terminal_id_C, n1);
db::Net *n2 = new db::Net ("n2");
circuit->add_net (n2);
circuit->connect_pin (pin_b.id (), n2);
d1->connect_terminal (db::DeviceClassBJT4Transistor::terminal_id_B, n2);
d2->connect_terminal (db::DeviceClassBJT4Transistor::terminal_id_B, n2);
d2->connect_terminal (db::DeviceClassBJT4Transistor::terminal_id_E, n2);
db::Net *n3 = new db::Net ("n3");
circuit->add_net (n3);
circuit->connect_pin (pin_c.id (), n3);
d1->connect_terminal (db::DeviceClassBJT4Transistor::terminal_id_E, n3);
db::Net *n4 = new db::Net ("n4");
circuit->add_net (n4);
circuit->connect_pin (pin_d.id (), n4);
d1->connect_terminal (db::DeviceClassBJT4Transistor::terminal_id_S, n4);
d2->connect_terminal (db::DeviceClassBJT4Transistor::terminal_id_S, n4);
EXPECT_EQ (nl.to_string (),
"circuit '' (A=n1,B=n2,C=n3,D=n4);\n"
" device '' d1 (C=n1,B=n2,E=n3,S=n4) (AE=2,PE=12,AB=3,PB=13,AC=4,PC=14);\n"
" device '' d2 (C=n1,B=n2,E=n2,S=n4) (AE=3,PE=13,AB=4,PB=14,AC=5,PC=15);\n"
"end;\n"
);
nl.combine_devices ();
// no combination as emitters are connected differently
EXPECT_EQ (nl.to_string (),
"circuit '' (A=n1,B=n2,C=n3,D=n4);\n"
" device '' d1 (C=n1,B=n2,E=n3,S=n4) (AE=2,PE=12,AB=3,PB=13,AC=4,PC=14);\n"
" device '' d2 (C=n1,B=n2,E=n2,S=n4) (AE=3,PE=13,AB=4,PB=14,AC=5,PC=15);\n"
"end;\n"
);
d2->connect_terminal (db::DeviceClassBJT4Transistor::terminal_id_E, n3);
EXPECT_EQ (nl.to_string (),
"circuit '' (A=n1,B=n2,C=n3,D=n4);\n"
" device '' d1 (C=n1,B=n2,E=n3,S=n4) (AE=2,PE=12,AB=3,PB=13,AC=4,PC=14);\n"
" device '' d2 (C=n1,B=n2,E=n3,S=n4) (AE=3,PE=13,AB=4,PB=14,AC=5,PC=15);\n"
"end;\n"
);
nl.combine_devices ();
EXPECT_EQ (nl.to_string (),
"circuit '' (A=n1,B=n2,C=n3,D=n4);\n"
" device '' d1 (C=n1,B=n2,E=n3,S=n4) (AE=5,PE=25,AB=7,PB=27,AC=9,PC=29);\n"
"end;\n"
);
}