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Added analyical model test which compares measured delay to model delay.
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@@ -24,19 +24,7 @@ class bitcell(design.design):
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self.width = bitcell.width
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self.height = bitcell.height
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self.pin_map = bitcell.pin_map
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# def analytical_delay(self, corner, slew, load=0, swing = 0.5):
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# # delay of bit cell is not like a driver(from WL)
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# # so the slew used should be 0
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# # it should not be slew dependent?
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# # because the value is there
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# # the delay is only over half transsmission gate
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# from tech import spice
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# r = spice["min_tx_r"]*3
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# c_para = spice["min_tx_drain_c"]
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# result = self.cal_delay_with_rc(corner, r = r, c = c_para+load, slew = slew, swing = swing)
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# return result
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def analytical_delay(self, corner, slew, load=0, swing = 0.5):
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parasitic_delay = 1
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size = 0.5 #This accounts for bitline being drained thought the access TX and internal node
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