Added analyical model test which compares measured delay to model delay.

This commit is contained in:
Hunter Nichols
2019-04-03 16:26:20 -07:00
parent f6eefc1728
commit cc5b347f42
11 changed files with 71 additions and 170 deletions
+1 -13
View File
@@ -24,19 +24,7 @@ class bitcell(design.design):
self.width = bitcell.width
self.height = bitcell.height
self.pin_map = bitcell.pin_map
# def analytical_delay(self, corner, slew, load=0, swing = 0.5):
# # delay of bit cell is not like a driver(from WL)
# # so the slew used should be 0
# # it should not be slew dependent?
# # because the value is there
# # the delay is only over half transsmission gate
# from tech import spice
# r = spice["min_tx_r"]*3
# c_para = spice["min_tx_drain_c"]
# result = self.cal_delay_with_rc(corner, r = r, c = c_para+load, slew = slew, swing = swing)
# return result
def analytical_delay(self, corner, slew, load=0, swing = 0.5):
parasitic_delay = 1
size = 0.5 #This accounts for bitline being drained thought the access TX and internal node