ngspice/DEVICES

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DEVICES
---------------------------------------------------------------------------
This file contains the status of devices available in ngspice. This file
will be updated every time the device pecific code is altered or changed.
This file it is useful in writing ngspice documentation.
***************************************************************************
************************* Linear devices ********************************
***************************************************************************
CAP - Capacitor
Initial Release.
Ver: N/A
Class: C
Level: 1 (and only)
Status:
Enhancements over the original model:
- Parallel Multiplier
- Temperature difference from circuit temperature
- Preliminary technology scaling support
- Model capacitance
- Cj calculation based on relative dielectric constant
and insulator thickness
IND - Inductor
Initial Release.
Ver: N/A
Class: L
Level: 1 (and only)
Status:
Enhancements over the original model:
- Parallel Multiplier
- Temperature difference from circuit temperature
- Preliminary technology scaling support
- Model inductance
- Inductance calculation for toroids or solenoids
on the model line.
RES - Simple linear resistor
Initial Release.
Ver: N/A
Class: R
Level: 1 (and only)
Status:
Enhancements over the original model:
- Parallel Multiplier
- Different value for ac analysis
- Temperature difference from circuit temperature
- Noiseless resistor
- Flicker noise
- Preliminary technology scaling support
***************************************************************************
********************* Distributed elements ********************************
***************************************************************************
TRA - Transmission line
Initial release
LTRA - Lossy Transmission line
Initial release
URC - Uniform distributed RC line
Initial release
***************************************************************************
**************************** V/I Sources *****************************
***************************************************************************
ASRC - Arbitrary Source
Initial Release
CCCS - Current Controlled Current Source
Initial Release
CCVS - Current Controlled Voltage Source
Initial Release
ISRC - Independent Current Source
Initial Release
VCCS - Voltage Controlled Current Source
Initial Release
VCVS - Voltage Controlled Voltage Source
Initial Release
VSRC - Independent Voltage Source
Initial Release
***************************************************************************
**************************** Switches ****************************
***************************************************************************
CSW - Current controlled switch
Initial release
SW - Voltage controlled switch
Initial release
***************************************************************************
**************************** Diodes ****************************
***************************************************************************
DIO - Junction Diode
Initial Release.
Ver: N/A
Class: D
Level: 1 (and only)
Status:
Enhancements over the original model:
- Parallel Multiplier
- Temperature difference from circuit temperature
- Forward and reverse knee currents
- Periphery (sidewall) effects
- Temperature correction of some parameters
***************************************************************************
************************* Bipolar Devices *************************
***************************************************************************
BJT - Bipolar Junction Transistor
Initial Release.
Ver: N/A
Class: Q
Level: 1
Status:
Enhancements over the original model:
- Parallel Multiplier
- Temperature difference from circuit temperature
- Different area parameters for collector, base and emitter
BJT2 - Bipolar Junction Trasistor
Initial Release.
Ver: N/A
Class: Q
Level: 2
Status:
This is the BJT model written by Alan Gillespie to support lateral
devices. The model has been hacked by Dietmar Warning fixing some bugs
and adding some features (temp. correction on resistors).
Enhancements over the original model:
- Temperature correction on rc,rb,re
- Parallel Multiplier
- Temperature difference from circuit temperature
- Different area parameters for collector, base and emitter
***************************************************************************
***************************** FET Devices ***************************
***************************************************************************
JFET - Junction Field Effect transistor
Initial Release.
Ver: N/A
Class: J
Level: 1
Status:
This is the original spice JFET model.
Enhancements over the original model:
- Alan Gillespie's modified diode model
- Parallel multiplier
- Instance temperature as difference for circuit temperature
JFET2 - Junction Field Effect Transistor (PS model)
Initial Release.
Ver: N/A
Class: J
Level: 2
Status:
This is the Parker Skellern model.
Web Site:
http://www.elec.mq.edu.au/cnerf/models/psmodel/
Enhancements over the original model:
- Parallel multiplier
- Instance temperature as difference for circuit temperature
***************************************************************************
*************************** HFET devices ***************************
***************************************************************************
HFET - HFET Level 1 (MacSpice3f4)
Initial Release.
Ver: N/A
Class: Z
Level: 5
Status:
Enhancements over the original model:
- Parallel multiplier
- Instance temperature as difference for circuit temperature
- Added pole-zero analysis
HFET2 - HFET Level 2 (MacSpice3f4)
Initial Release.
Ver: N/A
Class: Z
Level: 6
Status:
Enhancements over the original model:
- Parallel multiplier
- Instance temperature as difference for circuit temperature
- Added pole-zero analysis
***************************************************************************
*************************** MES devices ***************************
***************************************************************************
MES - MESfet model
Initial Release.
Ver: N/A
Class: Z
Level: 1
Status:
Enhancements over the original model:
- Parallel multiplier
- Alan Gillespie junction diodes implementation
MESA - MESA model (MacSpice3f4)
Initial Release.
Ver: N/A
Class: Z
Level: 2,3,4
Status:
This is a multilevel model. It contains code for mesa levels
2,3 and 4
Enhancements over the original model:
- Parallel multiplier
- Instance temperature as difference from circuit temperature
- Added pole-zero analysis
***************************************************************************
**************************** MOS devices ****************************
***************************************************************************
MOS1 - Level 1 MOS model
Initial Release.
Ver: N/A
Class: M
Level: 1
Status:
This is the so-called Schichman-Hodges model.
Enhancements over the original model:
- Parallel multiplier
- Temperature difference from circuit temperature
MOS2 - Level 2 MOS model
Initial Release.
Ver: N/A
Class: M
Level: 2
Status:
This is the so-called Grove-Frohman model.
Enhancements over the original model:
- Parallel multiplier
- Temperature difference from circuit temperature
MOS3 - Level 3 MOS model
Initial Release.
Ver: N/A
Class: M
Level: 3
Status:
Enhancements over the original model:
- Parallel multiplier
- Temperature difference from circuit temperature
MOS6 - Level 6 MOS model
Initial Release.
Ver: N/A
Class: M
Level: 6
Status:
Enhancements over the original model:
- Parallel multiplier
- Temperature difference from circuit temperature
MOS9 - Level 9 MOS model
Initial Release.
Ver: N/A
Class: M
Level: 9
Status:
Enhancements over the original model:
- Temperature difference from circuit temperature
BSIM1 - BSIM model level 1
Initial Release.
Ver: N/A
Class: M
Level: 4
Status:
Enhancements over the original model:
- Parallel multiplier
- Noise analysis
BUGS:
Distortion analysis probably does not
work with "parallel" devices. Equations
are too intricate to deal with. Any one
has ideas on the subject ?
BSIM2 - BSIM model level 2
Initial Release.
Ver: N/A
Class: M
Level: 5
Status:
Enhancements over the original model:
- Parallel multiplier
- Noise analysis
BSIM3 - BSIM model level 3
Initial Release.
Ver: 3.2.4
Class: M
Level: 8
Status: TO BE TESTED
This is the BSIM3v3.2.4 model from Berkeley device group.
You can find some test netlists with results for this model
on its web site.
Web site:
http://www-device.eecs.berkeley.edu/~bsim3
Enhancements over the original model:
- Parallel Multiplier
- ACM Area Calculation Method
- Multirevision code (supports all 3v3.2 minor revisions)
- NodesetFix
BSIM3v1 - BSIM model level 3
Initial Release.
Ver: N/A
Class: M
Level: 49
Status: TO BE TESTED AND IMPROVED
This is the BSIM3v3.1 model modified by Serban Popescu.
This is level 49 model. It is an implementation that supports
"HDIF" and "M" parameters.
BSIM3v2 - BSIM model level 3
Initial Relese.
Ver: 3.2
Class: M
Level: 50
Status: TO BE TESTED
This is the BSIM3v3.2 model. It is included only for compatibility
with existing netlists and parameters files. As always, tests
are availabe on the Berkeley's device group site.
Web site:
http://www-device.eecs.berkeley.edu/~bsim3
BSIM4 - BSIM model level 4 (0.18 um)
Initial Release.
Ver: 4.2.1 (Updated in rework 14)
Class: M
Level: 14
Status: TO BE TESTED
This is the BSIM4 device model from Berkeley Device Group.
Test are available on its web site.
Web site:
http://www-device.eecs.berkeley.edu/~bsim3/bsim4.html
*) Rework 14: Updated to 4.21 YET UNTESTED.
HiSIM - Hiroshima-university STARC IGFET Model
Initial Release.
Ver: 1.2.0
Class: M
Level: TBD
Status: TO BE TESTED
This is the HiSIM model available from Hiroshima University
(Ultra-Small Device Engineering Laboratory)
Web site:
http://home.hiroshima-u.ac.jp/usdl/HiSIM.shtml
http://www.starc.or.jp/kaihatu/pdgr/hisim/index.html
Enhancements over the original model:
- Parallel Multiplier
- NodesetFix
***************************************************************************
***************************** SOI Devices ****************************
***************************************************************************
BSIM3SOI_FD - SOI model (fully depleted devices)
Initial Release.
Ver: 2.1.
Class: M
Level: 11
Status: TO BE TESTED.
FD model has been integrated.
There is a bsim3soifd directory under the test
hierarchy. Test circuits come from the bsim3soi
Web site at:
http://www-device.eecs.berkeley.edu/~bsimsoi
*) rework-14: removed #ifndef NEWCONV code.
BSIM3SOI_PD - SOI model (partially depleted devices)
Initial Release.
Ver: 2.2.1
Class: M
Level: 10
Status: TO BE TESTED.
PD model has been integrated.
There is a bsim3soipd directory under the test
hierarchy. Test circuits come from the bsim3soi
Web site at:
http://www-device.eecs.berkeley.edu/~bsimsoi
*) rework-14: removed #ifndef NEWCONV code.
BSIM3SOI_DD - SOI Model (dynamic depletion model)
Initial Release.
Ver: 2.1
Class: M
Level: 12
Status: TO BE TESTED.
There is a bsim3soidd directory under the
test hierarchy. Test circuits come from bsim3soi
Web site at:
http://www-device.eecs.berkeley.edu/~bsimsoi
*) rework-14: removed #ifndef NEWCONV code.
SOI3 - STAG SOI3 Model
Initial Release.
Ver: 2.6
Class: M
Level: 62
Status: TO BE TESTED
Web site at:
http://www.micro.ecs.soton.ac.uk/stag/
***************************************************************************
**************** Other devices not released as source code ****************
***************************************************************************
EKV - EKV model
Initial Release.
Ver: 2.6
Class: M
Level: 44
Status: TO BE TESTED
Note: This model is not released in source code.
You have to obtain the source code from the address below.
Web site at:
http://legwww.epfl.ch/ekv/