dwarning
|
5e0726195d
|
model qa check for other simulator
|
2015-03-30 16:02:41 +02:00 |
|
dwarning
|
d09ad841ac
|
few unifications for better qa tests and recover permission of run scripts
|
2015-03-30 11:48:29 +02:00 |
|
dwarning
|
b742df6e85
|
repair hisim qa test by changing transistor type
|
2014-05-10 14:07:48 +02:00 |
|
dwarning
|
2ff867c1d0
|
clarify level parameter for hisim and hisimhv
|
2014-05-07 18:45:45 +02:00 |
|
dwarning
|
ca902610f6
|
correct parameter names for hisim qa checks
|
2014-01-11 16:24:15 +01:00 |
|
dwarning
|
2602c1d22a
|
update hisim to version 2.7.0
|
2012-11-21 22:04:48 +01:00 |
|
dwarning
|
a087c3697e
|
update hisim to version 2.7.0
|
2012-11-21 20:36:53 +01:00 |
Francesco Lannutti
|
08ec219417
|
remove all .cvsignore files
|
2012-10-26 18:30:14 +02:00 |
|
dwarning
|
b829555f7c
|
hisim2 new qa tests
|
2012-10-24 08:46:13 +02:00 |
h_vogt
|
db1fe413fe
|
remove test1.cir from EXTRA_DIST
|
2011-06-02 06:26:18 +00:00 |
rlar
|
12b3cc52ec
|
CMC test suite, fix choice of results subdirectory
|
2011-05-31 20:09:34 +00:00 |
|
rlar
|
89beb5db3a
|
updates for `make dist'
|
2011-05-31 15:52:52 +00:00 |
|
rlar
|
19cff2c4be
|
incorporate CMC test suite into make target 'check'
|
2011-05-30 18:47:05 +00:00 |
|
rlar
|
c6f674d0e1
|
CMC test suite, cleanup
|
2011-05-29 10:43:20 +00:00 |
|
dwarning
|
aeef26ecd4
|
HiSIM1 to HiSIM2
|
2011-05-28 18:59:06 +00:00 |
|
dwarning
|
62245b2fba
|
CMC test suite
|
2011-05-28 18:51:45 +00:00 |
|
rlar
|
68b2e6b23a
|
whitespace cleanup (all Makefile.am files)
|
2010-09-17 16:11:25 +00:00 |
|
h_vogt
|
f727fd6c8e
|
.options noacct
|
2009-02-22 19:29:44 +00:00 |
sjborley
|
802d224cdd
|
Added .cvsignore to several tests directories
|
2007-12-14 10:10:12 +00:00 |
pnenzi
|
f8ff8283dc
|
Updated tests.
|
2005-08-27 18:53:51 +00:00 |
|
pnenzi
|
ef0657e7e9
|
Updated tests for hisim device.
|
2004-08-09 15:29:44 +00:00 |
|
pnenzi
|
9066452b23
|
Trimmed Makefiles.am for "make dist" and added tests placeholders.
|
2004-02-14 19:19:23 +00:00 |
|
pnenzi
|
66b915f8dd
|
Initial import. Hisim test circuit.
|
2003-09-29 20:33:53 +00:00 |