number of terminals for devices that don't have the usual gate/
source/drain terminals (e.g., diodes, resistors, capacitors) when
writing the devices with re-mapped terminals into the .res.ext
file. Also: Changed the size of the word containing the name
refcount for "equiv" statements, since an accidental shorting
of pins can cause a large number of "equiv" statements in a .ext
file, causing an overrun of the previously 1-byte refcount (this
probably does not make the structure any longer, since it likely
has to fit to a word boundary).
this limited ports to 16384, which seemed reasonable at the time.
However, the sky130_sram_macro layouts connect power and ground in a
way that when coupled with "extract unique" can generate tens of
thousands of ports and overrun the bit field, showing that automation
can do the unexpected. The solution was to split out the port number
from the label record as its own 32-bit value.
support of devices with terminals on different plances, such as
capacitors, diodes, and bipolar transistors. Output now appears
to give meaningful results for flattened layouts, although
numerous issues remain for hierarchical layouts.
the right argument type (float, not int). Otherwise all resistances
from extresist come out zero when doing "ext2spice extresist on"
and "ext2spice hierarchy on". Also changed the format of the resistance
in the SPICE output to type float, since values are in standard units of
ohms, and rounding to the nearest ohm seems excessively coarse-grained.
a long-standing error (introduced with the "extresist geometry"
option) that can cause nets not to be extracted (due to the first
record not having extraction data, which was itself a long-standing
error in the code but which was not fixed correctly); (2) handle
"device mosfet" type transistors (previously only handled the old
"fet" type extraction devices); and (3) correct for the res.ext
file having a different scalefactor relative to the .ext file. The
latter item was solved by forcing all input to scale like
ExtCurStyle->exts_unitsPerLambda, locally correcting all input as
needed. Note that extresist still needs to handle other extraction
devices (e.g., resistors and capacitors) but those will require
additional handling in the routines which analyze the current path
to determine how to break up wires into paths.
simple FET device in extresist. Also: Extended the bloat-all CIF operator
again, allowing the trigger layer for the bloat operation to include both
CIF layers and magic layers (previously only magic layers were supported).
This extension is possible due to the previous extension allowing the
trigger layer and bloating layers to be on separate planes. This operator
extension is useful for tagging geometry that is in the proximity of, but
not overlapping, geometry on another plane.
to be more robust and not depend on the ordering of the devices in
the techfile. The extraction method now keeps a mask of which
properties of the device (source/drain types, substrate type,
identifier type) have been found, and will look only for device
records that match what is known about the device. Added a device
identifier record which is the last record before parameters if the
record begins with "+". This allows marker layers to be placed
over a device such that it will extract with a different type.
This helps reduce the complexity of the techfile and allows
certain specialized devices like RF or ESD to be identified without
a separate layer type for the device.
Tim Edwards