This is reducing nearby calls to TiGetClient() API when the value
can be looked up one time and stored in a local variable to make
other decisions about.
This is due to TiGetClient() potentially having a slightly higher
cost to call than previously, this is a kind of peephole
optimization approach (if I can see multiple getters used within
the window it got optmized).
'ticlient' was used for retrieval as ClientData so that future
greps across the codebase for `ti_client` should only match naked
access.
All naked access to `ti_client` now uses the function-like-macro
to encapsulate this action. This macro existed before this just
makes all sites utilize it.
Added additional INT and PTR variants to remove the programmer
load on thinking about casing and casts polluting the point
of use. So the use now looks cleaner.
Equivalent prototypes:
void TiSetClient(Tile*, ClientData)
void TiSetClientINT(Tile*, intptr_t) /* pointertype */
void TiSetClientPTR(Tile*, void*)
ClientData TiGetClient(Tile*)
intptr_t TiGetClientINT(Tile*) /* pointertype */
void *TiGetClientPTR(Tile*)
a transistor's first tile record is a well or substrate type;
normally this is avoided, but if that's the only device terminal
that connects to the node, it will be used. Also changed the
code to not report a failure when space is found under the
device, when space is allowed as a substrate type. Instead it
will print a message that the substrate is not being extracted as
a resistive network. However, note that the correct solution is
to do what the regular "extract" code does, which is to paint the
substrate type in the cell area first, so that there are valid
tile types to use for extracting the substrate network.
non-Manhattan geometry is analyzed for resistance extraction.
This patch merely prevents the crash condition. It does not
solve the root of the problem, which is that split tiles can
belong to two different nets, but the tile can hold extraction
information for at most one of those nets.
a method that failed to work on devices with complex shapes on the
device recognition layer, such as snake-geometry resistors. (2)
The use of contact type "xpc" in the sky130 tech file as its own
contact residue caused the contact tracing in extresist to fail.
I opted to keep the unorthodox contact description in the tech
file and wrote an extension to a routine in extresist to handle
the case.
different way. Added a routine to remove all layers of a contact
from all planes except the contact's base plane before finding
and processing contacts. This causes ExtFindRegions() to find
and process only one tile on one plane per contact, so there are
no redundant contact entries. Also, any overlapping stacked
contacts are resolved, which avoids the very common error of
contacts not being processed at the correct size because they
are being processed per tile for chopped-up areas.
was made to limit the ExtFindRegions() search to one plane per
contact. Fixed this simply by doubling the resistance per via
so that the final result is correct.
causing the SI suffix not to be the expected one. Adjusted the
bounds where each SI suffix is used to keep output in the range of
0.1 to 100, although the boundary is very subjective. Made a
correction to the extresist code to scan through all device records
for a tile type. However, (1) there are cases being missed, and (2)
this should not be necessary since all device types should be able
to be known exactly from the contents of the .sim file. Needs more
work.
222 from Sean Cross. Corrected a few places where the blanket
conversion "Region"->"ExtRegion" picked up some comment lines
that were unrelated to the structure name.
natural sort instead of ASCII-based sorting, so that ports that
are numbered arrays will be indexed properly by count. Also:
Modified the "extresist" handling of substrate to draw the default
substrate type over the entire cell area (less areas of nwell or
other conflicting type). This allows extresist to extract the
entire substrate as a resistive network. The result is ugly and
may warrant some aggressive network simplification, but it should
at least be realistic.
in the input. The name of one was being modified but was being
right-justified into the string, resulting in a name starting with
many space characters. Also: Fixed an issue with extresist where
a label that ends up with an empty string can become a node with
an empty string name in the .res.ext file output.
solution; it would be much better to make the value adjustible, but
the array of tiles sized to LAYERS_PER_CONTACT is a Region structure,
and the routine that frees the Region structures does not have a way
to call a routine to take additional measures like free'ing a sub-
structure of the Region. A proper solution will require some work.
messages which was traced to code that changes a drivepoint position
to match a label; the same drivepoint may be part of the record for
the initial position to search on the net, in which case if the
position is changed, then the tile type needs to be changed to match
the new position.
this appears to work correctly but does not yet handle the implicit
substrate (space as substrate) or "virtually" isolated substrate regions
(which need to be removed for full parasitic extraction).
text formatting. Made one critical correction to ResGetDevice() to
pass the device type; otherwise, devices on different planes (e.g.,
MiM caps) with the same coordinate will always return the device on
the lowest plane, leading to incorrect results and an eventual crash
when the device record is free'd twice.
support of devices with terminals on different plances, such as
capacitors, diodes, and bipolar transistors. Output now appears
to give meaningful results for flattened layouts, although
numerous issues remain for hierarchical layouts.
necessarily a 1:1 correspondence from tile types to extracted
device names, and not necessarily a 1:1 correspondence in the other
direction, either. So the search for devices at the location given
by the .sim file has been loosened to look for any tile type at that
location. Matches are restricted to those in which the plane of the
type found is the same as the plane of the device recorded in the .sim
file; this prevents matching device like MiM caps that may be in the
same location as a device in another plane.
the last commit, unfortunately. Thanks to Matt Guthaus for alerting me
to this. Also updated parts of the extresist code that remove the
dependence on ResConDCS; this is a minor update and should not affect
the operation of extresist. It is preparatory to doing more work to
support additional device types like capacitors, bipolars, and diodes.
recursive loop and crash magic. Corrected a number of other issues
along the way, especially one where routines in EFantenna and extresist
make use of array EFDevTypes which was only created by ext2sim and
ext2spice, and freed when done. Having run extresist through valgrind,
there are still issues in the code.
commit, mostly relating to the scale of values in the ".nodes" file
produced by ext2sim. Making this file CIF syntax seemed unnecessary,
so I removed the CIF syntax and scaling. "extresist" can now produce
an apparently valid output on a standard cell layout. Even with the
change, the extresist output is still only pseudo-hierarchical, so
this does not preclude the need for eliminating the .sim format file
in favor of the .ext file, but it provides a working intermediate
form.
sticky flag set, and the type of the label does not correspond
exactly to the type under the label (e.g., label defined on m1
but is on top of a contact).
simple FET device in extresist. Also: Extended the bloat-all CIF operator
again, allowing the trigger layer for the bloat operation to include both
CIF layers and magic layers (previously only magic layers were supported).
This extension is possible due to the previous extension allowing the
trigger layer and bloating layers to be on separate planes. This operator
extension is useful for tagging geometry that is in the proximity of, but
not overlapping, geometry on another plane.
hierarchical cells (namely a scaling issue with .sim file units).
More can be done to make the extresist command more user friendly,
but at least port connections as drivers appears to work.
to be more robust and not depend on the ordering of the devices in
the techfile. The extraction method now keeps a mask of which
properties of the device (source/drain types, substrate type,
identifier type) have been found, and will look only for device
records that match what is known about the device. Added a device
identifier record which is the last record before parameters if the
record begins with "+". This allows marker layers to be placed
over a device such that it will extract with a different type.
This helps reduce the complexity of the techfile and allows
certain specialized devices like RF or ESD to be identified without
a separate layer type for the device.
Darryl L. Miles
Tim Edwards
Sean Cross