to be more robust and not depend on the ordering of the devices in
the techfile. The extraction method now keeps a mask of which
properties of the device (source/drain types, substrate type,
identifier type) have been found, and will look only for device
records that match what is known about the device. Added a device
identifier record which is the last record before parameters if the
record begins with "+". This allows marker layers to be placed
over a device such that it will extract with a different type.
This helps reduce the complexity of the techfile and allows
certain specialized devices like RF or ESD to be identified without
a separate layer type for the device.
where devices extracted as "device resistor" or "device capacitor"
and defining parameters (e.g., area, perimeter) will generate the
device arguments in the wrong order in the .ext file, resulting in
incorrect readback when attempting to do ext2spice, resulting in the
device being omitted from the resulting netlist.
all the settings normally used for LVS (hierarchy on, cthresh
infinite, subcircuit top auto, etc.). (2) Extract and extract
unique ignore cells marked as abstract views (property LEFview
is set) when checking for unconnected nets with the same name
label.
in the SPICE netlist when using new device "csubcircuit" due to
a mismatch in the expected number of parameters. However, more
work needs to be done to cover capacitor top and bottom plates on
different planes.
added a long time ago, since capacitors use a different method for
calculating width and length than either transistors or resistors,
so subcircuits need a special class designator or else the extraction
may calculate the wrong dimensions for device width by totalling the
perimeter between the device and terminal types, as it would for a
MOSFET.
development had been halted since it was first created back in April.
Version 8.2 is now the official development version, with the first
development push to create a Cairo graphics interface.
Tim Edwards