the last couple of days, was left in a state where it keeps appending
".mag" to the filename if "save" or "writeall" is executed more than
once in the same edit session. Also, added ext2sim.sh and ext2spice.sh
to the CLEANS list in tcltk, and added both to .gitignore so they are
not tracked. Removed them from git to stop the current tracking.
as an optional argument (which it is), and so defaults were not
applied, potentially leading to the wrong number of rows/columns in
a generated via if ROWCOL is not present in the DEF file.
of the pin port geometry and using those areas to create the
spacing between them and the obstruction layer. Otherwise, the
existing method used different databases (source vs. flattened) to
find the pin area, and they did not always agree on the exact
dimensions, leading to spacing errors within the LEF view.
than one name, because in that case one of the port records ends
up with a null pointer to a node, and causes a crash condition.
This can happen inadvertently, as when a connected node is not
specifically designated a port, but is forced to be a port
because of the connection.
coordinate system origin to the specified (current) location.
This is a much more efficient method than selecting everything in
a layout and moving it, especially for very large layouts where
selection and moving becomes prohibitive.
generating duplicate devices that may have parts overlaid in
different subcells; this failed to filter the check by plane of
the device, and so if any two devices exist at the same point in
two different planes (e.g., metal resistor and a transistor), one
of them would get eliminated.
multiple ports; also, when using the "-hide" option, the obstruction
area is computed from layer geometry, not from the bounding box.
Still left to do: Ensure minimum width on pins, and remove slivers
of obstruction that are below minimum width.
substrate more than once for the same subcell, since the substrate
extraction method scans the entire plane area; this was making
large standard cell layouts extract very slowly, as every component
cell was causing the substrate search to be repeated.
extraction: Fixed a problem causing long extraction times, at
least some of which had to do with a poor string hash function
implementation. Fixed a huge problem in ext2spice, where the
node merge function was particularly poorly implemented, causing
exponentially increasing processing times with layout size.
Corrected a minor issue with ext2spice where arguments were
improperly specified, causing unnecessary error messages to be
issued. Fixed an error in the "load -dereference" command option,
which again caused unnecessary error messages to be issued.
Changed .gitignore to ignore Depend files, which are now regenerated
on every build.
uninitialized variable, with the result that writing GDS would
claim that it cannot scale down enough and that the output units
are either wrong or the output style must have "units angstroms".
Using angstrom units would solve the problem but did not treat
the root of the problem.
from the cifoutput section, NOT the cifinput section. This change
underscores the point that LEF and DEF formats define mask data,
and therefore all LEF and DEF routines should be using the CIF
input/output methods and layers. That is a major code change;
meanwhile, getting via layer values from the cifoutput parameters
is slightly more reliable than using cifinput, since there is good
reason to use templayers to read vias, and that sort of indirection
makes it difficult to determine a simple relationship between a
LEF cut layer and a magic contact.
order of layers than specified in the LEF/DEF spec. It is not clear
whether this is common practice, or a bug in the tool that produced the
DEF file that prompted this change. NOTE: The "grow" function applied
in this case should be replaced by the actual GDS input rule sequence,
that includes the grow and shrink merge. Otherwise, vias read from
DEF files do not match the layout from those read from GDS, even though
the mask layers represented by the layouts are the same.
DRC records contain an index into a string array instead of containing
a copy of a string. This is preliminary to changing the way the DRC
error plane is painted, so that the types painted will mark the error
type. This will (1) allow "drc why" to simply scan the DRC error
plane rather than running the DRC engine, (2) allow DRC errors to be
counted by area rather than by tile, and (3) let the DRC count be the
same whether done by "drc listall why" or "drc count".
which had been changed a few months back to remove the individual
cell count and only list the top level cell. The behavior has been
changed a bit so that "list" returns values for the top level cell
only, but "listall" returns a complete list. "drc list count total"
gives the DRC count for the top cell, but "drc listall count total"
gives the DRC count for everything (probably not very useful).
Also: Implemented a behavior by request to automatically removed
the (UNNAMED) cell whenever a new cell is loaded and the (UNNAMED)
cell has not been modified.
to be investigated here. I am no longer sure why I removed the
cell search from DRC count, but it appears that the cell search is
non-functional, and it should be determined why. There is no
particular reason not to have a DRC count search. It could be
implemented such that "list" vs. "listall" counts the top cell vs.
all cells. First it must be determined why there are no subcell
counts.
Tim Edwards