28 lines
723 B
Plaintext
28 lines
723 B
Plaintext
* Shot noise test with B source, diode
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* voltage on device (diode, forward)
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Vdev out 0 DC 0 PULSE(0.4 0.45 10u)
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* diode, forward direction, to be modeled with noise
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D1 mess 0 DMOD
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.model DMOD D IS=1e-14 N=1
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X1 0 mess out ishot
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* device between 1 and 2
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* new output terminals of device including noise: 1 and 3
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.subckt ishot 1 2 3
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* white noise source with rms 1V
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VNG 0 11 DC 0 TRNOISE(1 1n 0 0)
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*measure the current i(v1)
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V1 2 3 DC 0
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* calculate the shot noise
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* sqrt(2*current*q*bandwidth)
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BI 1 3 I=sqrt(2*abs(i(v1))*1.6e-19*1e7)*v(11)
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.ends ishot
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* 20000 sample points
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.tran 1n 20u
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.control
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run
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plot (-1)*i(vdev)
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meas tran vdev_rms avg i(vdev) from=0u to=9.9u
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meas tran vdev_rms avg i(vdev) from=10.1u to=20u
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.endc
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.end
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