rlar c8aac12374 regression test for device.c "alter"

2018-05-15 22:33:50 +02:00

..

func

inp_do_macro_param_replace(), fix several bugs concerning .func processing

2014-07-08 18:19:26 +02:00

lib-processing

regression/**/*.cir, hide printed numeric values in some test cases

2017-09-16 20:32:05 +02:00

misc

asrc/asrcacld.c, bug fix, reciproc tc coefficient

2018-02-25 21:59:15 +01:00

model

tests/regression/model/special-names-1.cir, check "#307 define problems with the Modelname "mname" with Subcircuits"

2015-05-10 21:47:14 +02:00

parser

regression/**/*.cir, hide printed numeric values in some test cases

2017-09-16 20:32:05 +02:00

pipe

regression test for device.c "alter"

2018-05-15 22:33:50 +02:00

pz

tests/regression/pz/ac-resistance.cir, check ac resistance (op, ac and pz)

2015-05-10 21:47:18 +02:00

sens

tests/regression/sens, fix test cases

2017-04-21 18:52:43 +02:00

subckt-processing

missing file in commit "b14eb0a4 * regression test for multiple .global cards"

2014-08-08 19:13:19 +02:00

temper

upgrade regression test to the previous commit

2015-11-22 19:37:48 +01:00

Makefile.am

regression test for device.c "alter"

2018-05-15 22:33:50 +02:00