..
analog_models1_ac.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
analog_models1_dc.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
analog_models1_swept_dc.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
analog_models1_transient.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
analog_models2_ac.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
analog_models2_dc.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
analog_models2_swept_dc.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
analog_models2_transient.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
analog_models3_ac.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
analog_models3_dc.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
analog_models3_swept_dc.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
analog_models3_transient.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
analog_models4_ac.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
analog_models4_dc.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
analog_models4_swept_dc.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
analog_models4_transient.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
arbitrary_phase.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
bad_io.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
bad_io_type.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
bad_name.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
bad_param.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
bad_param_type.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
diffpair.in
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
digital_invert.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
digital_models.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
digital_models1.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
digital_models2.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
digital_models3.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
digital_models4.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
dot_model_ref.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
hybrid_models1_dc.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
hybrid_models1_transient.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
initial_conditions.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
io_ordering.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
io_types.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
long_names.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
mixed_case.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
mixed_io_size.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
mixed_mode.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
mixed_ref.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
mosamp2.in
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
mosmem.in
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
param_defaults.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
param_types.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
parsing.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
polarity.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
rca3040.in
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
rtlinv.in
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
schmitt.in
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
spice3.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
suffixes.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
supply_ramping.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
user_defined_nodes.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00
xspice.deck
Paranoia_Parallel: a test suite for more than 100 test circuits,
2026-06-29 17:35:00 +02:00