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ECL
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Update to device lib: device name starts with N
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2022-11-12 23:21:49 +01:00 |
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capacitor
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(testig) node collapsing bugfix
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2022-08-12 16:08:03 +02:00 |
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cccs
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feat: OSDI integration prototype
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2022-08-12 16:08:02 +02:00 |
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ccvs
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feat: OSDI integration prototype
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2022-08-12 16:08:02 +02:00 |
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diode
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update osdi version
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2022-08-12 16:08:03 +02:00 |
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diode_mod
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New and updated test cases
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2022-10-31 16:30:42 +01:00 |
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hicuml0
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New and updated test cases
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2022-10-31 16:30:42 +01:00 |
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hicuml2
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feat: OSDI integration prototype
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2022-08-12 16:08:02 +02:00 |
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inductor
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feat: OSDI integration prototype
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2022-08-12 16:08:02 +02:00 |
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multiple_devices
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(testing) multiple devices test improvement
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2022-08-12 16:08:03 +02:00 |
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node_collapsing
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(testig) node collapsing bugfix
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2022-08-12 16:08:03 +02:00 |
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resistor
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(testig) node collapsing bugfix
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2022-08-12 16:08:03 +02:00 |
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test-bsimbulk
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Add failure modes to example input
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2022-11-16 21:24:42 +01:00 |
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test-bsimcmg
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Add some instance parameters to device
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2022-11-16 21:24:21 +01:00 |
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test-psp102
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(non-working) PSP102 examples
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2022-10-31 16:35:18 +01:00 |
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test-psp103
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Linear area transfer curves
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2022-11-12 23:51:06 +01:00 |
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vccs
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feat: OSDI integration prototype
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2022-08-12 16:08:02 +02:00 |
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vcvs
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feat: OSDI integration prototype
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2022-08-12 16:08:02 +02:00 |
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testing.py
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fix: make testing script work with python version before 3.9
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2022-08-12 16:08:03 +02:00 |