Single NMOS degradation

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Holger Vogt 2026-02-13 17:03:21 +01:00
parent 9e97aac1dd
commit dc7d61591a
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test of integrated degradation monitor
*Inverter sequence
.lib "$PDK_ROOT/$PDK/libs.tech/ngspice/models/cornerMOSlv.lib" mos_tt
.include "aging_par_ng.scs"
* the voltage sources:
Vdd vdd gnd DC 1.8
Vss vss 0 0
V1 in gnd pulse(0 1.8 0p 100p 100p 0.5n 2n)
xm02 vdd in vss vss sg13_lv_nmos l=0.15u w=0.495u as=0.131175p ad=0.131175p ps=1.52u pd=1.52u
*adegmon1 %v([z a vss vss]) mon degmon1
*.model degmon1 degmon (tfuture=315336e4 l=0.15e-6 devmod="sg13_lv_nmos")
* simulation command:
.tran 1ps 20ns 0 10p
.control
pre_osdi ../lib/ngspice/psp103_nqs.osdi
pre_osdi ../lib/ngspice/psp103.osdi
run
rusage
*plot Vss#branch
degsim
run
*set nolegend
set xbrushwidth=2
plot Vss#branch tran1.Vss#branch
.endc
.end