Single NMOS degradation
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test of integrated degradation monitor
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*Inverter sequence
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.lib "$PDK_ROOT/$PDK/libs.tech/ngspice/models/cornerMOSlv.lib" mos_tt
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.include "aging_par_ng.scs"
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* the voltage sources:
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Vdd vdd gnd DC 1.8
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Vss vss 0 0
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V1 in gnd pulse(0 1.8 0p 100p 100p 0.5n 2n)
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xm02 vdd in vss vss sg13_lv_nmos l=0.15u w=0.495u as=0.131175p ad=0.131175p ps=1.52u pd=1.52u
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*adegmon1 %v([z a vss vss]) mon degmon1
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*.model degmon1 degmon (tfuture=315336e4 l=0.15e-6 devmod="sg13_lv_nmos")
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* simulation command:
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.tran 1ps 20ns 0 10p
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.control
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pre_osdi ../lib/ngspice/psp103_nqs.osdi
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pre_osdi ../lib/ngspice/psp103.osdi
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run
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rusage
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*plot Vss#branch
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degsim
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run
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*set nolegend
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set xbrushwidth=2
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plot Vss#branch tran1.Vss#branch
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.endc
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.end
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