* tests/Makefile.am: Updates for new files.

* tests/respart.cir tests/respart.out tests/respart.sh:
	Additional tests for resistor.

	* tests/resistance/respart.cir: Moved into tests directory.

ChangeLog

@@ -1,3 +1,8 @@
+2000-05-01  Arno W. Peters  <A.W.Peters@ieee.org>
+
+	* tests/respart.cir, tests/respart.out, tests/respart.sh:
+	additional tests for resistor.
+
 1999-12-07  Arno Peters  <A.W.Peters@ieee.org>
 
 	* source tree: Added MAINTAINERCLEANFILES to Makefile.am to

tests/Makefile.am

@@ -1,6 +1,6 @@
 ## Process this file with automake to produce Makefile.in
 
-TESTS = diffpair.sh fourbitadder.sh resistor.sh
+TESTS = diffpair.sh fourbitadder.sh resistor.sh respart.sh
 
 TESTS_ENVIRONMENT = $(SHELL)
 
@@ -13,6 +13,8 @@ EXTRA_DIST = \
 	fourbitadder.cir	\
 	fourbitadder.out	\
 	resistor.cir		\
-	resistor.out
+	resistor.out		\
+	respart.cir		\
+	respart.out
 
 MAINTAINERCLEANFILES = Makefile.in

tests/respart.out

@@ -0,0 +1,46 @@
+
+Circuit: * Resistive partition with different ratios for AC/DC (Print V(2))
+
+Circuit: * Resistive partition with different ratios for AC/DC (Print V(2))
+
+
+
+Operating point information:
+
+	Node	Voltage
+	----	-------
+	V(2)	5.000000e-01
+	V(1)	1.000000e+00
+
+	Source	Current
+	------	-------
+
+	vin#branch	-1.00000e-04
+
+ Resistor models (Simple linear resistor)
+ model             R
+
+       rsh         0
+    narrow         0
+       tc1         0
+       tc2         0
+      defw     1e-05
+
+ Resistor: Simple linear resistor
+ device           r2        r1
+ model             R         R
+resistance     5e+03     5e+03
+        ac   1.5e+04     5e+03
+         i    0.0001    0.0001
+         p     5e-05     5e-05
+
+ Vsource: Independent voltage source
+ device          vin
+        dc         1
+     acmag         1
+         i   -0.0001
+         p    0.0001
+
+
+
+

tests/respart.sh

@@ -0,0 +1,4 @@
+#! /bin/sh
+
+. $srcdir/config.sh
+spicetest respart