Fixed MOS2 scaling.
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7b1ecb261b
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1a175dde2f
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@ -34,7 +34,7 @@ MOS2load(GENmodel *inModel, CKTcircuit *ckt)
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double GateBulkOverlapCap;
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double GateDrainOverlapCap;
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double GateSourceOverlapCap;
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double OxideCap;
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double OxideCap, unscaledOxideCap;
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double SourceSatCur;
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double arg;
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double cbhat;
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@ -144,8 +144,8 @@ MOS2load(GENmodel *inModel, CKTcircuit *ckt)
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here->MOS2m * EffectiveLength;
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Beta = here->MOS2tTransconductance * here->MOS2w *
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here->MOS2m/EffectiveLength;
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OxideCap = model->MOS2oxideCapFactor * EffectiveLength *
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here->MOS2m * here->MOS2w;
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unscaledOxideCap = model->MOS2oxideCapFactor * EffectiveLength * here->MOS2w;
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OxideCap = unscaledOxideCap*here->MOS2m;
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if(SenCond){
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@ -599,7 +599,7 @@ next1: if(vbs <= -3*vt) {
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/*XXX constant per device */
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factor = 0.125*model->MOS2narrowFactor*2.0*M_PI*EPSSIL/
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OxideCap*EffectiveLength;
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unscaledOxideCap*EffectiveLength;
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/*XXX constant per device */
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eta = 1.0+factor;
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vbin = here->MOS2tVbi*model->MOS2type+factor*phiMinVbs;
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@ -664,7 +664,7 @@ next1: if(vbs <= -3*vt) {
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1e4 /*(cm**2/m**2)*/;
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cdonco = -(gamasd*dsrgdb+dgddvb*sarg1)+factor;
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xn = 1.0+cfs/OxideCap*here->MOS2m*
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xn = 1.0+cfs/unscaledOxideCap*
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here->MOS2w*EffectiveLength+cdonco;
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tmp = vt*xn;
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@ -134,9 +134,9 @@ MOS2noise(int mode, int operation, GENmodel * genmodel, CKTcircuit * ckt,
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N_GAIN, inst->MOS2dNodePrime, inst->MOS2sNodePrime,
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(double) 0.0);
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if (newcompat.s3) {
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noizDens[MOS2FLNOIZ] *= model->MOS2fNcoef *
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noizDens[MOS2FLNOIZ] *= inst->MOS2m * model->MOS2fNcoef *
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exp(model->MOS2fNexp *
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log(MAX(fabs(inst->MOS2cd), N_MINLOG))) /
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log(MAX(fabs(inst->MOS2cd / inst->MOS2m), N_MINLOG))) /
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(data->freq *
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inst->MOS2w *
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(inst->MOS2l - 2 * model->MOS2latDiff) *
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@ -144,18 +144,18 @@ MOS2noise(int mode, int operation, GENmodel * genmodel, CKTcircuit * ckt,
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} else {
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switch (model->MOS2nlev) {
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case 0:
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noizDens[MOS2FLNOIZ] *= model->MOS2fNcoef *
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noizDens[MOS2FLNOIZ] *= inst->MOS2m * model->MOS2fNcoef *
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exp(model->MOS2fNexp *
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log(MAX(fabs(inst->MOS2cd), N_MINLOG))) /
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log(MAX(fabs(inst->MOS2cd / inst->MOS2m), N_MINLOG))) /
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(data->freq *
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(inst->MOS2l - 2 * model->MOS2latDiff) *
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(inst->MOS2l - 2 * model->MOS2latDiff) *
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model->MOS2oxideCapFactor);
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break;
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case 1:
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noizDens[MOS2FLNOIZ] *= model->MOS2fNcoef *
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noizDens[MOS2FLNOIZ] *= inst->MOS2m * model->MOS2fNcoef *
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exp(model->MOS2fNexp *
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log(MAX(fabs(inst->MOS2cd), N_MINLOG))) /
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log(MAX(fabs(inst->MOS2cd / inst->MOS2m), N_MINLOG))) /
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(data->freq *
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inst->MOS2w *
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(inst->MOS2l - 2 * model->MOS2latDiff) *
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@ -163,7 +163,7 @@ MOS2noise(int mode, int operation, GENmodel * genmodel, CKTcircuit * ckt,
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break;
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case 2: case 3:
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noizDens[MOS2FLNOIZ] *= model->MOS2fNcoef *
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inst->MOS2gm * inst->MOS2gm /
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inst->MOS2gm * inst->MOS2gm / inst->MOS2m /
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(pow(data->freq, model->MOS2fNexp) *
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inst->MOS2w *
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(inst->MOS2l - 2 * model->MOS2latDiff) *
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