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Tim Edwards
c7f27c909f
include calculations of effective width due to the addition of width of multiple device instances in parallel. The original behavior of splitting all "M=" devices into individual instances has been effectively inverted, instead combining all parallel devices of the same class into one, with multiple property records for devices with non-matching properties (e.g., width, length, etc.). Property matching combines devices with different "critical properties" (e.g., FET gate width) if these are defined in the setup using the "property merge" command. Not yet done: Matching of multiple property records when critial properties are not defined, handling of critical properties that combine in parallel instead of simple addition, handling of devices that combine in series, and the combination of non-critical properties (e.g., source and drain area, although these are usually removed from matching).