include calculations of effective width due to the addition of
width of multiple device instances in parallel. The original
behavior of splitting all "M=" devices into individual instances
has been effectively inverted, instead combining all parallel
devices of the same class into one, with multiple property
records for devices with non-matching properties (e.g., width,
length, etc.). Property matching combines devices with different
"critical properties" (e.g., FET gate width) if these are defined
in the setup using the "property merge" command.
Not yet done: Matching of multiple property records when
critial properties are not defined, handling of critical properties
that combine in parallel instead of simple addition, handling of
devices that combine in series, and the combination of non-critical
properties (e.g., source and drain area, although these are usually
removed from matching).
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