this appears to work correctly but does not yet handle the implicit
substrate (space as substrate) or "virtually" isolated substrate regions
(which need to be removed for full parasitic extraction).
text formatting. Made one critical correction to ResGetDevice() to
pass the device type; otherwise, devices on different planes (e.g.,
MiM caps) with the same coordinate will always return the device on
the lowest plane, leading to incorrect results and an eventual crash
when the device record is free'd twice.
a long-standing error (introduced with the "extresist geometry"
option) that can cause nets not to be extracted (due to the first
record not having extraction data, which was itself a long-standing
error in the code but which was not fixed correctly); (2) handle
"device mosfet" type transistors (previously only handled the old
"fet" type extraction devices); and (3) correct for the res.ext
file having a different scalefactor relative to the .ext file. The
latter item was solved by forcing all input to scale like
ExtCurStyle->exts_unitsPerLambda, locally correcting all input as
needed. Note that extresist still needs to handle other extraction
devices (e.g., resistors and capacitors) but those will require
additional handling in the routines which analyze the current path
to determine how to break up wires into paths.
simple FET device in extresist. Also: Extended the bloat-all CIF operator
again, allowing the trigger layer for the bloat operation to include both
CIF layers and magic layers (previously only magic layers were supported).
This extension is possible due to the previous extension allowing the
trigger layer and bloating layers to be on separate planes. This operator
extension is useful for tagging geometry that is in the proximity of, but
not overlapping, geometry on another plane.
to be more robust and not depend on the ordering of the devices in
the techfile. The extraction method now keeps a mask of which
properties of the device (source/drain types, substrate type,
identifier type) have been found, and will look only for device
records that match what is known about the device. Added a device
identifier record which is the last record before parameters if the
record begins with "+". This allows marker layers to be placed
over a device such that it will extract with a different type.
This helps reduce the complexity of the techfile and allows
certain specialized devices like RF or ESD to be identified without
a separate layer type for the device.
Tim Edwards