support of devices with terminals on different plances, such as
capacitors, diodes, and bipolar transistors. Output now appears
to give meaningful results for flattened layouts, although
numerous issues remain for hierarchical layouts.
the last commit, unfortunately. Thanks to Matt Guthaus for alerting me
to this. Also updated parts of the extresist code that remove the
dependence on ResConDCS; this is a minor update and should not affect
the operation of extresist. It is preparatory to doing more work to
support additional device types like capacitors, bipolars, and diodes.
extresist extractor is less sophisticated than the standard extraction
and will not check through the list of device records belonging to a
single device type. Therefore a device in the .res.ext may have a
different device name. So name hashing and checks are made against
the tile type, not the device name, as the tile type + device
coordinates is sufficient to uniquely identify the device. However,
the extresist extractor does need to be sophisticated enough to find
all the terminal types, so that needs to be fixed.
recursive loop and crash magic. Corrected a number of other issues
along the way, especially one where routines in EFantenna and extresist
make use of array EFDevTypes which was only created by ext2sim and
ext2spice, and freed when done. Having run extresist through valgrind,
there are still issues in the code.
commit, mostly relating to the scale of values in the ".nodes" file
produced by ext2sim. Making this file CIF syntax seemed unnecessary,
so I removed the CIF syntax and scaling. "extresist" can now produce
an apparently valid output on a standard cell layout. Even with the
change, the extresist output is still only pseudo-hierarchical, so
this does not preclude the need for eliminating the .sim format file
in favor of the .ext file, but it provides a working intermediate
form.
types and substrate connections. This is an intermediate step to
switching from a sim file format to an ext file format for input,
but resolves the worst issues of having the sim file not recognize
the devices or the substrate nodes. Implemented by using the sim
subcircuit format introduced in IRSIM with the "user subcircuit"
package. Implementation unfinished (work in progress).
a long-standing error (introduced with the "extresist geometry"
option) that can cause nets not to be extracted (due to the first
record not having extraction data, which was itself a long-standing
error in the code but which was not fixed correctly); (2) handle
"device mosfet" type transistors (previously only handled the old
"fet" type extraction devices); and (3) correct for the res.ext
file having a different scalefactor relative to the .ext file. The
latter item was solved by forcing all input to scale like
ExtCurStyle->exts_unitsPerLambda, locally correcting all input as
needed. Note that extresist still needs to handle other extraction
devices (e.g., resistors and capacitors) but those will require
additional handling in the routines which analyze the current path
to determine how to break up wires into paths.
with ext2spice without the hierarchy option. More work needed to
produce correct hierarchical output and to support extraction
devices other than the old "fet" record.
simple FET device in extresist. Also: Extended the bloat-all CIF operator
again, allowing the trigger layer for the bloat operation to include both
CIF layers and magic layers (previously only magic layers were supported).
This extension is possible due to the previous extension allowing the
trigger layer and bloating layers to be on separate planes. This operator
extension is useful for tagging geometry that is in the proximity of, but
not overlapping, geometry on another plane.
hierarchical cells (namely a scaling issue with .sim file units).
More can be done to make the extresist command more user friendly,
but at least port connections as drivers appears to work.
to be more robust and not depend on the ordering of the devices in
the techfile. The extraction method now keeps a mask of which
properties of the device (source/drain types, substrate type,
identifier type) have been found, and will look only for device
records that match what is known about the device. Added a device
identifier record which is the last record before parameters if the
record begins with "+". This allows marker layers to be placed
over a device such that it will extract with a different type.
This helps reduce the complexity of the techfile and allows
certain specialized devices like RF or ESD to be identified without
a separate layer type for the device.
Tim Edwards