commit, mostly relating to the scale of values in the ".nodes" file
produced by ext2sim. Making this file CIF syntax seemed unnecessary,
so I removed the CIF syntax and scaling. "extresist" can now produce
an apparently valid output on a standard cell layout. Even with the
change, the extresist output is still only pseudo-hierarchical, so
this does not preclude the need for eliminating the .sim format file
in favor of the .ext file, but it provides a working intermediate
form.
could cause serious errors on systems that do not auto-zero allocated
memory. Also: Fixed an error introduced by a recent commit to allocate
character memory for efReadLine() which frees the memory before reading
a .res.ext file, causing a crash when using "ext2spice" with the
"extresist on" option.
simple FET device in extresist. Also: Extended the bloat-all CIF operator
again, allowing the trigger layer for the bloat operation to include both
CIF layers and magic layers (previously only magic layers were supported).
This extension is possible due to the previous extension allowing the
trigger layer and bloating layers to be on separate planes. This operator
extension is useful for tagging geometry that is in the proximity of, but
not overlapping, geometry on another plane.
hierarchical cells (namely a scaling issue with .sim file units).
More can be done to make the extresist command more user friendly,
but at least port connections as drivers appears to work.
to be more robust and not depend on the ordering of the devices in
the techfile. The extraction method now keeps a mask of which
properties of the device (source/drain types, substrate type,
identifier type) have been found, and will look only for device
records that match what is known about the device. Added a device
identifier record which is the last record before parameters if the
record begins with "+". This allows marker layers to be placed
over a device such that it will extract with a different type.
This helps reduce the complexity of the techfile and allows
certain specialized devices like RF or ESD to be identified without
a separate layer type for the device.
Tim Edwards