The '&' has higher precedence, so the expression of the '&' side receive
extra parentheses.
ResMakeRes.c:671:37: warning: suggest parentheses around '&&' within '||'
ResMakeRes.c:942:32: warning: suggest parentheses around '&&' within '||'
ResSimple.c:201:70: warning: suggest parentheses around '&&' within '||'
ResRex.c:1036:28: warning: suggest parentheses around '&&' within '||'
ResRex.c:1038:50: warning: suggest parentheses around '&&' within '||'
ext2sim.c:1341:47: warning: suggest parentheses around '&&' within '||'
ext2spice.c:172:44: warning: suggest parentheses around '&&' within '||'
ext2spice.c:173:49: warning: suggest parentheses around '&&' within '||'
ext2spice.c:3655:50: warning: suggest parentheses around '&&' within '||'
ext2hier.c:1412:50: warning: suggest parentheses around '&&' within '||'
gcrDebug.c:638:55: warning: suggest parentheses around '&&' within '||'
selEnum.c:323:28: warning: suggest parentheses around '&&' within '||'
GCC14 -Wall cleanup series [-Wparentheses]
gparams.rg_ttype seems to be the only value of the correct type that has connectivity with the callsite.
Copilot Autofix rejected: ResGetDevice(gparams.rg_devloc, /* second argument */);
resis/ResSimple.c
9aa39f82 (2021-05-25 22:41:52 -0400 1039) resDevice *res = ResGetDevice(gparams.rg_devloc);
commit 9aa39f820f (tag: 8.3.169)
Date: Tue May 25 22:41:52 2021 -0400
routine that marks resistors in loops to prevent infinite
recursion, but later incorrectly eliminates those resistors.
Also: Changed the "tolerance" command to affect only the R-C
time constant tolerance. Added a "threshold" command option
that limits output of small resistors. This can help reduce
large networks that are otherwise not reducible by the three
methods of reduction (serial, parallel, and delta-wye), but
does affect output values (slightly). This will probably need
to be revisited at some point.
cuts per contact area during parasitic resistance extraction.
Previously, the result was divided by the via pitch twice,
resulting in most contact areas being reported as a single
cut.
this appears to work correctly but does not yet handle the implicit
substrate (space as substrate) or "virtually" isolated substrate regions
(which need to be removed for full parasitic extraction).
text formatting. Made one critical correction to ResGetDevice() to
pass the device type; otherwise, devices on different planes (e.g.,
MiM caps) with the same coordinate will always return the device on
the lowest plane, leading to incorrect results and an eventual crash
when the device record is free'd twice.
a long-standing error (introduced with the "extresist geometry"
option) that can cause nets not to be extracted (due to the first
record not having extraction data, which was itself a long-standing
error in the code but which was not fixed correctly); (2) handle
"device mosfet" type transistors (previously only handled the old
"fet" type extraction devices); and (3) correct for the res.ext
file having a different scalefactor relative to the .ext file. The
latter item was solved by forcing all input to scale like
ExtCurStyle->exts_unitsPerLambda, locally correcting all input as
needed. Note that extresist still needs to handle other extraction
devices (e.g., resistors and capacitors) but those will require
additional handling in the routines which analyze the current path
to determine how to break up wires into paths.
simple FET device in extresist. Also: Extended the bloat-all CIF operator
again, allowing the trigger layer for the bloat operation to include both
CIF layers and magic layers (previously only magic layers were supported).
This extension is possible due to the previous extension allowing the
trigger layer and bloating layers to be on separate planes. This operator
extension is useful for tagging geometry that is in the proximity of, but
not overlapping, geometry on another plane.
to be more robust and not depend on the ordering of the devices in
the techfile. The extraction method now keeps a mask of which
properties of the device (source/drain types, substrate type,
identifier type) have been found, and will look only for device
records that match what is known about the device. Added a device
identifier record which is the last record before parameters if the
record begins with "+". This allows marker layers to be placed
over a device such that it will extract with a different type.
This helps reduce the complexity of the techfile and allows
certain specialized devices like RF or ESD to be identified without
a separate layer type for the device.
Darryl L. Miles
Tim Edwards