intent to handle multiple isolated substrate regions. A previous
version of this was added to the master branch but that method had
too many issues and is being deprecated. This version is also very
experimental and is a work in progress.
to stop the search whenever a cell is not found. Used this to implement
a new option for GDS writes, "gds undefined allow|disallow" (default
"disallow") controls whether or not GDS with undefined references will
be allowed to be written. Similarly affects CIF and LEF writes, extraction,
and DRC (when running "drc check" from the top).
to be more robust and not depend on the ordering of the devices in
the techfile. The extraction method now keeps a mask of which
properties of the device (source/drain types, substrate type,
identifier type) have been found, and will look only for device
records that match what is known about the device. Added a device
identifier record which is the last record before parameters if the
record begins with "+". This allows marker layers to be placed
over a device such that it will extract with a different type.
This helps reduce the complexity of the techfile and allows
certain specialized devices like RF or ESD to be identified without
a separate layer type for the device.
Tim Edwards