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WIP: netlist compare - terminal swapping of devices.

This commit is contained in:
Matthias Koefferlein 2019-03-26 22:05:08 +01:00
parent e0cb3f6303
commit 46cd80d606
5 changed files with 380 additions and 17 deletions
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11
src/db/db/dbDeviceClass.h
View File

@ -403,6 +403,17 @@ public:
return false;
}
/**
* @brief Normalizes the terminal IDs to indicate terminal swapping
*
* This method returns a "normalized" terminal ID. For example, for MOS
* transistors where S and D can be exchanged, D will be mapped to S.
*/
virtual size_t normalize_terminal_id (size_t tid) const
{
return tid;
}
private:
friend class Netlist;

5
src/db/db/dbNetlist.cc
View File

@ -668,7 +668,10 @@ static void read_device_terminals (tl::Extractor &ex, db::Device *device, std::m
static void read_device_parameters (tl::Extractor &ex, db::Device *device)
{
ex.expect ("(");
if (! ex.test ("(")) {
return;
}
while (! ex.test (")")) {
ex.expect_more ();

25
src/db/db/dbNetlistDeviceClasses.h
View File

@ -67,6 +67,11 @@ public:
virtual void parallel (Device *a, Device *b) const;
virtual void serial (Device *a, Device *b) const;
virtual size_t normalize_terminal_id (size_t) const
{
return terminal_id_A;
}
};
/**
@ -92,6 +97,11 @@ public:
virtual void parallel (Device *a, Device *b) const;
virtual void serial (Device *a, Device *b) const;
virtual size_t normalize_terminal_id (size_t) const
{
return terminal_id_A;
}
};
/**
@ -117,6 +127,11 @@ public:
virtual void parallel (Device *a, Device *b) const;
virtual void serial (Device *a, Device *b) const;
virtual size_t normalize_terminal_id (size_t) const
{
return terminal_id_A;
}
};
/**
@ -176,6 +191,11 @@ public:
virtual bool combine_devices (Device *a, Device *b) const;
virtual bool supports_parallel_combination () const { return true; }
virtual size_t normalize_terminal_id (size_t tid) const
{
return tid == terminal_id_D ? terminal_id_S : tid;
}
protected:
void combine_parameters (Device *a, Device *b) const;
};
@ -198,6 +218,11 @@ public:
return new DeviceClassMOS4Transistor (*this);
}
virtual size_t normalize_terminal_id (size_t tid) const
{
return tid == terminal_id_D ? terminal_id_S : tid;
}
virtual bool combine_devices (Device *a, Device *b) const;
};

21
src/db/db/gsiDeclDbNetlist.cc
View File

@ -586,11 +586,27 @@ public:
m_supports_serial_combination = f;
}
void equivalent_terminal_id (size_t tid, size_t equiv_tid)
{
m_equivalent_terminal_ids.insert (std::make_pair (tid, equiv_tid));
}
virtual size_t normalize_terminal_id (size_t tid) const
{
std::map<size_t, size_t>::const_iterator ntid = m_equivalent_terminal_ids.find (tid);
if (ntid != m_equivalent_terminal_ids.end ()) {
return ntid->second;
} else {
return tid;
}
}
gsi::Callback cb_combine_devices;
private:
bool m_supports_parallel_combination;
bool m_supports_serial_combination;
std::map<size_t, size_t> m_equivalent_terminal_ids;
};
}
@ -655,6 +671,11 @@ Class<GenericDeviceClass> decl_GenericDeviceClass (decl_dbDeviceClass, "db", "Ge
"Serial device combination means that the devices are connected by internal nodes. "
"If the device does not support this combination mode, this predicate can be set to false. This will make the device "
"extractor skip the combination test in serial mode and improve performance somewhat."
) +
gsi::method ("equivalent_terminal_id", &GenericDeviceClass::equivalent_terminal_id, gsi::arg ("original_id"), gsi::arg ("equivalent_id"),
"@brief Specifies a terminal to be equivalent to another.\n"
"Use this method to specify two terminals to be exchangeable. For example to make S and D of a MOS transistor equivalent, "
"call this method with S and D terminal IDs. In netlist matching, S will be translated to D and thus made equivalent to D."
),
"@brief A generic device class\n"
"This class allows building generic device classes. Specificially, terminals can be defined "

335
src/db/unit_tests/dbNetlistCompareTests.cc
View File

@ -193,18 +193,7 @@ private:
static size_t translate_terminal_id (size_t tid, const db::Device *device)
{
// @@@ delegate to device class
if (dynamic_cast<const db::DeviceClassMOS3Transistor *> (device->device_class ())) {
if (tid == db::DeviceClassMOS3Transistor::terminal_id_D) {
return db::DeviceClassMOS3Transistor::terminal_id_S;
}
} else if (dynamic_cast<const db::DeviceClassMOS4Transistor *> (device->device_class ())) {
if (tid == db::DeviceClassMOS4Transistor::terminal_id_D) {
return db::DeviceClassMOS4Transistor::terminal_id_S;
}
}
return tid;
// @@@
return device->device_class () ? device->device_class ()->normalize_terminal_id (tid) : tid;
}
static size_t translate_subcircuit_pin_id (size_t pid, const db::Circuit * /*circuit*/)
@ -326,7 +315,11 @@ public:
if (circuit_map) {
std::map<const db::Circuit *, CircuitMapper>::const_iterator icm = circuit_map->find (cr);
tl_assert (icm != circuit_map->end ());
if (icm == circuit_map->end ()) {
// this can happen if the other circuit is not present - this is allowed for single-pin
// circuits.
continue;
}
cm = & icm->second;
}
@ -820,10 +813,17 @@ bool
NetlistComparer::all_subcircuits_verified (const db::Circuit *c, const std::set<const db::Circuit *> &verified_circuits) const
{
for (db::Circuit::const_subcircuit_iterator sc = c->begin_subcircuits (); sc != c->end_subcircuits (); ++sc) {
if (verified_circuits.find (sc->circuit_ref ()) == verified_circuits.end ()) {
const db::Circuit *cr = sc->circuit_ref ();
// typical via subcircuits attach through one pin. We can safely ignore such subcircuits because they don't
// contribute graph edges.
if (cr->pin_count () > 1 && verified_circuits.find (cr) == verified_circuits.end ()) {
return false;
}
}
return true;
}
@ -856,7 +856,11 @@ compute_subcircuit_key (const db::SubCircuit &subcircuit, const db::NetDeviceGra
if (circuit_map) {
std::map<const db::Circuit *, CircuitMapper>::const_iterator icm = circuit_map->find (cr);
tl_assert (icm != circuit_map->end ());
if (icm == circuit_map->end ()) {
// this can happen if the other circuit does not exist - in this case the key is an invalid one which cannot
// be produced by a regular subcircuit.
return k;
}
cm = & icm->second;
cr = cm->other ();
}
@ -1141,7 +1145,7 @@ NetlistComparer::compare_circuits (const db::Circuit *c1, const db::Circuit *c2,
if (! mapped) {
mp_logger->subcircuit_mismatch (sc.operator-> (), 0);
good = false;
} else {
} else if (! k.empty ()) {
// TODO: report devices which cannot be distiguished topologically?
subcircuit_map.insert (std::make_pair (k, sc.operator-> ()));
}
@ -1332,6 +1336,30 @@ static void prep_nl (db::Netlist &nl, const char *str)
dc->set_name ("NMOS");
nl.add_device_class (dc);
dc = new db::DeviceClassMOS4Transistor ();
dc->set_name ("PMOS4");
nl.add_device_class (dc);
dc = new db::DeviceClassMOS4Transistor ();
dc->set_name ("NMOS4");
nl.add_device_class (dc);
dc = new db::DeviceClassResistor ();
dc->set_name ("RES");
nl.add_device_class (dc);
dc = new db::DeviceClassCapacitor ();
dc->set_name ("CAP");
nl.add_device_class (dc);
dc = new db::DeviceClassInductor ();
dc->set_name ("IND");
nl.add_device_class (dc);
dc = new db::DeviceClassDiode ();
dc->set_name ("DIODE");
nl.add_device_class (dc);
nl.from_string (str);
}
@ -1652,6 +1680,214 @@ TEST(6_BufferTwoPathsAdditionalDevices)
EXPECT_EQ (good, false);
}
TEST(7_Resistors)
{
const char *nls1 =
"circuit TRIANGLE ($0=P1,$1=P2,$2=P3);\n"
" device RES $1 (A=P1,B=P2) (R=1.5);\n"
" device RES $2 (A=P2,B=P3) (R=2.5);\n"
" device RES $3 (A=P3,B=P1) (R=3);\n"
"end;\n";
const char *nls2 =
"circuit TRIANGLE ($0=P1,$1=P2,$2=P3);\n"
" device RES $2 (A=P2,B=P3) (R=2.5);\n"
" device RES $1 (A=P2,B=P1) (R=1.5);\n"
" device RES $3 (A=P3,B=P1) (R=3);\n"
"end;\n";
db::Netlist nl1, nl2;
prep_nl (nl1, nls1);
prep_nl (nl2, nls2);
NetlistCompareTestLogger logger;
db::NetlistComparer comp (&logger);
bool good = comp.compare (&nl1, &nl2);
EXPECT_EQ (logger.text (),
"begin_circuit TRIANGLE TRIANGLE\n"
"match_nets P1 P1\n"
"match_nets P3 P3\n"
"match_nets P2 P2\n"
"match_pins $1 $1\n"
"match_pins $0 $0\n"
"match_pins $2 $2\n"
"match_devices $2 $1\n"
"match_devices $1 $2\n"
"match_devices $3 $3\n"
"end_circuit TRIANGLE TRIANGLE MATCH"
);
EXPECT_EQ (good, true);
}
TEST(7_ResistorsParameterMismatch)
{
const char *nls1 =
"circuit TRIANGLE ($0=P1,$1=P2,$2=P3);\n"
" device RES $1 (A=P1,B=P2) (R=1.5);\n"
" device RES $2 (A=P2,B=P3) (R=2.5);\n"
" device RES $3 (A=P3,B=P1) (R=3);\n"
"end;\n";
const char *nls2 =
"circuit TRIANGLE ($0=P1,$1=P2,$2=P3);\n"
" device RES $1 (A=P2,B=P1) (R=1.5);\n"
" device RES $3 (A=P3,B=P1) (R=3.5);\n"
" device RES $2 (A=P2,B=P3) (R=2.5);\n"
"end;\n";
db::Netlist nl1, nl2;
prep_nl (nl1, nls1);
prep_nl (nl2, nls2);
NetlistCompareTestLogger logger;
db::NetlistComparer comp (&logger);
bool good = comp.compare (&nl1, &nl2);
EXPECT_EQ (logger.text (),
"begin_circuit TRIANGLE TRIANGLE\n"
"match_nets P2 P2\n"
"match_nets P1 P1\n"
"match_nets P3 P3\n"
"match_pins $1 $1\n"
"match_pins $0 $0\n"
"match_pins $2 $2\n"
"match_devices $1 $1\n"
"match_devices_with_different_parameters $3 $2\n"
"match_devices $2 $3\n"
"end_circuit TRIANGLE TRIANGLE NOMATCH"
);
EXPECT_EQ (good, false);
}
TEST(7_ResistorsPlusOneDevice)
{
const char *nls1 =
"circuit TRIANGLE ($0=P1,$1=P2,$2=P3);\n"
" device RES $1 (A=P1,B=P2) (R=1.5);\n"
" device RES $2 (A=P2,B=P3) (R=2.5);\n"
" device RES $3 (A=P3,B=P1) (R=3);\n"
"end;\n";
const char *nls2 =
"circuit TRIANGLE ($0=P1,$1=P2,$2=P3);\n"
" device RES $1 (A=P2,B=P1) (R=1.5);\n"
" device RES $3 (A=P3,B=P1) (R=3);\n"
" device CAP $4 (A=P1,B=P2) (C=1e-4);\n"
" device RES $2 (A=P2,B=P3) (R=2.5);\n"
"end;\n";
db::Netlist nl1, nl2;
prep_nl (nl1, nls1);
prep_nl (nl2, nls2);
NetlistCompareTestLogger logger;
db::NetlistComparer comp (&logger);
bool good = comp.compare (&nl1, &nl2);
EXPECT_EQ (logger.text (),
"begin_circuit TRIANGLE TRIANGLE\n"
"match_nets P3 P3\n"
"match_nets P2 P2\n"
"match_nets P1 P1\n"
"match_pins $1 $1\n"
"match_pins $0 $0\n"
"match_pins $2 $2\n"
"match_devices $1 $1\n"
"match_devices $3 $2\n"
"device_mismatch (null) $3\n"
"match_devices $2 $4\n"
"end_circuit TRIANGLE TRIANGLE NOMATCH"
);
EXPECT_EQ (good, false);
}
TEST(8_Diodes)
{
const char *nls1 =
"circuit TRIANGLE ($0=P1,$1=P2,$2=P3);\n"
" device DIODE $1 (A=P1,C=P2);\n"
" device DIODE $2 (A=P1,C=P3);\n"
" device DIODE $3 (A=P3,C=P2);\n"
"end;\n";
const char *nls2 =
"circuit TRIANGLE ($0=P1,$1=P2,$2=P3);\n"
" device DIODE $1 (A=P3,C=P2);\n"
" device DIODE $2 (A=P1,C=P3);\n"
" device DIODE $3 (A=P1,C=P2);\n"
"end;\n";
db::Netlist nl1, nl2;
prep_nl (nl1, nls1);
prep_nl (nl2, nls2);
NetlistCompareTestLogger logger;
db::NetlistComparer comp (&logger);
bool good = comp.compare (&nl1, &nl2);
EXPECT_EQ (logger.text (),
"begin_circuit TRIANGLE TRIANGLE\n"
"match_nets P1 P1\n"
"match_nets P3 P3\n"
"match_nets P2 P2\n"
"match_pins $0 $0\n"
"match_pins $2 $2\n"
"match_pins $1 $1\n"
"match_devices $3 $1\n"
"match_devices $2 $2\n"
"match_devices $1 $3\n"
"end_circuit TRIANGLE TRIANGLE MATCH"
);
EXPECT_EQ (good, true);
}
TEST(8_DiodesDontMatchOnSwappedPins)
{
const char *nls1 =
"circuit TRIANGLE ($0=P1,$1=P2,$2=P3);\n"
" device DIODE $1 (A=P1,C=P2);\n"
" device DIODE $2 (A=P2,C=P3);\n"
" device DIODE $3 (A=P3,C=P1);\n"
"end;\n";
const char *nls2 =
"circuit TRIANGLE ($0=P1,$1=P2,$2=P3);\n"
" device DIODE $3 (A=P3,C=P1);\n"
" device DIODE $1 (A=P2,C=P1);\n"
" device DIODE $2 (A=P2,C=P3);\n"
"end;\n";
db::Netlist nl1, nl2;
prep_nl (nl1, nls1);
prep_nl (nl2, nls2);
NetlistCompareTestLogger logger;
db::NetlistComparer comp (&logger);
bool good = comp.compare (&nl1, &nl2);
EXPECT_EQ (logger.text (),
"begin_circuit TRIANGLE TRIANGLE\n"
"match_ambiguous_nets P1 P3\n"
"match_nets P2 P1\n"
"match_nets P3 P2\n"
"match_pins $0 $2\n"
"match_pins $1 $0\n"
"match_pins $2 $1\n"
"match_devices $1 $1\n"
"device_mismatch (null) $2\n"
"match_devices $3 $3\n"
"device_mismatch $2 (null)\n"
"end_circuit TRIANGLE TRIANGLE NOMATCH"
);
EXPECT_EQ (good, false);
}
TEST(10_SimpleSubCircuits)
{
const char *nls1 =
@ -1834,3 +2070,70 @@ TEST(12_MismatchingSubcircuitsDuplicates)
EXPECT_EQ (good, false);
}
TEST(13_MismatchingSubcircuitsAdditionalHierarchy)
{
const char *nls1 =
"circuit INV ($0=IN,$1=OUT,$2=VDD,$3=VSS);\n"
" device PMOS $1 (S=VDD,G=IN,D=OUT) (L=0.25,W=0.95,AS=0.49875,AD=0.26125,PS=2.95,PD=1.5);\n"
" device NMOS $2 (S=VSS,G=IN,D=OUT) (L=0.25,W=0.95,AS=0.49875,AD=0.26125,PS=2.95,PD=1.5);\n"
"end;\n"
// a typical via:
"circuit VIA ($0=IN);\n"
"end;\n"
"circuit TOP ($0=IN,$1=OUT,$2=VDD,$3=VSS);\n"
" subcircuit INV $1 ($0=IN,$1=INT,$2=VDD,$3=VSS);\n"
" subcircuit VIA $3 ($0=IN);\n"
" subcircuit INV $2 ($0=INT,$1=OUT,$2=VDD,$3=VSS);\n"
"end;\n";
const char *nls2 =
"circuit INV ($0=VDD,$1=IN,$2=VSS,$3=OUT);\n"
" device NMOS $1 (S=OUT,G=IN,D=VSS) (L=0.25,W=0.95,AS=0.49875,AD=0.26125,PS=2.95,PD=1.5);\n"
" device PMOS $2 (S=VDD,G=IN,D=OUT) (L=0.25,W=0.95,AS=0.49875,AD=0.26125,PS=2.95,PD=1.5);\n"
"end;\n"
"circuit TOP ($0=OUT,$1=IN,$2=VDD,$3=VSS);\n"
" subcircuit INV $1 ($0=VDD,$1=INT,$2=VSS,$3=OUT);\n"
" subcircuit INV $2 ($0=VDD,$1=IN,$2=VSS,$3=INT);\n"
"end;\n";
db::Netlist nl1, nl2;
prep_nl (nl1, nls1);
prep_nl (nl2, nls2);
NetlistCompareTestLogger logger;
db::NetlistComparer comp (&logger);
bool good = comp.compare (&nl1, &nl2);
EXPECT_EQ (logger.text (),
"circuit_mismatch VIA (null)\n"
"begin_circuit INV INV\n"
"match_nets VSS VSS\n"
"match_nets VDD VDD\n"
"match_nets OUT OUT\n"
"match_nets IN IN\n"
"match_pins $3 $2\n"
"match_pins $2 $0\n"
"match_pins $1 $3\n"
"match_pins $0 $1\n"
"match_devices $2 $1\n"
"match_devices $1 $2\n"
"end_circuit INV INV MATCH\n"
"begin_circuit TOP TOP\n"
"match_nets IN IN\n"
"match_nets OUT OUT\n"
"match_nets VDD VDD\n"
"match_nets VSS VSS\n"
"match_nets INT INT\n"
"match_pins $0 $1\n"
"match_pins $1 $0\n"
"match_pins $2 $2\n"
"match_pins $3 $3\n"
"match_subcircuits $3 $1\n"
"match_subcircuits $1 $2\n"
"end_circuit TOP TOP MATCH"
);
EXPECT_EQ (good, false);
}