* Test netlist

* cell RINGO
* pin FB
* pin OSC
* pin VDD
* pin BULK,VSS
.SUBCKT RINGO 1 2 3 4
* net 1 FB
* net 2 OSC
* net 3 VDD
* net 4 BULK,VSS
* cell instance $1 r0 *1 19.42,-0.8
X$1 4 3 4 1 6 2 3 INV2PAIR
* cell instance $2 r0 *1 -1.7,-0.8
X$2 4 3 4 100 1 5 3 INV2PAIR
* cell instance $3 r0 *1 3.58,-0.8
X$3 4 3 4 101 5 8 3 INV2PAIR
* cell instance $4 r0 *1 8.86,-0.8
X$4 4 3 4 102 8 7 3 INV2PAIR
* cell instance $5 r0 *1 14.14,-0.8
X$5 4 3 4 103 7 6 3 INV2PAIR
.ENDS RINGO

* cell INV2PAIR
* pin BULK
* pin 
* pin 
* pin 
* pin 
* pin 
* pin 
.SUBCKT INV2PAIR 1 2 3 4 5 6 7
* net 1 BULK
* cell instance $1 r0 *1 1.7,0.8
X$1 7 5 4 3 2 1 INV2
* cell instance $2 r0 *1 4.34,0.8
X$2 7 4 6 3 2 1 INV2
.ENDS INV2PAIR

* cell INV2
* pin 
* pin IN
* pin OUT
* pin VSS
* pin VDD
* pin BULK
.SUBCKT INV2 1 2 3 4 5 6
* net 2 IN
* net 3 OUT
* net 4 VSS
* net 5 VDD
* net 6 BULK
* device instance $1 -0.4,3.2 PMOS
M$1 3 2 5 1 PMOS L=0.25U W=3.5U AS=1.4P AD=1.4P PS=6.85U PD=6.85U
* device instance $3 -0.4,-0.4 NMOS
M$3 3 2 4 6 NMOS L=0.25U W=3.5U AS=1.4P AD=1.4P PS=6.85U PD=6.85U
.ENDS INV2